Control Charts and Machine Learning for Anomaly Detection in Manufacturing

The book "Control Charts and Machine Learning for Anomaly Detection in Manufacturing" by Kim Phuc Tran offers a comprehensive introduction to the latest research on advanced control charts and innovative machine learning approaches for anomaly detection in the field of smart manufacturing. It combines statistical methods with modern machine learning techniques to promote interdisciplinary collaboration among various research areas. This is particularly relevant in the context of the fourth industrial revolution, where new approaches to anomaly detection are needed. The book includes practical algorithms and parameter sheets that enable readers to design advanced control charts and machine learning for anomaly detection in manufacturing. Case studies in each chapter assist practitioners in applying these tools in real manufacturing processes. It is aimed at researchers, professionals, and students in the fields of engineering, automation, statistical learning, and the manufacturing industry.