CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. It discusses SRAM operation basics, cell electrical and physical design, and a process-aware and economical approach to SRAM testing. The emphasis of the book is on the challenges and solutions of stability testing, as well as the development of an understanding of the link between process technology and SRAM circuit design in modern nano-scaled technologies.