CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

The book "CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies" offers a comprehensive analysis of the design and testing methods for SRAM circuits in modern, nano-scaled technologies. It addresses fundamental aspects of SRAM operation and delves into the electrical and physical design of SRAM cells in detail. A central theme of the book is the connection between process technology and the design of SRAM circuits, focusing on the challenges and solutions in the area of stability testing. The authors, Andrei Pavlov and Manoj Sachdev, present a process-oriented and cost-effective approach to testing SRAM, which is relevant for both professionals and students. This technical book is a valuable resource for anyone interested in the latest developments in SRAM technology.