Power-Aware Testing and Test Strategies for Low Power Devices

The book "Power-aware testing and test strategies for low power devices" offers a comprehensive analysis of the challenges and strategies in energy management for circuits and systems in the semiconductor industry. Given the growing importance of energy efficiency, this technical book covers various techniques such as dynamic voltage scaling, clock gating, and power management strategies. These methods are crucial for minimizing energy losses during operation. The work highlights the impact of these strategies on manufacturing tests and emphasizes the necessity of power-aware testing, which is increasingly integrated into the design-for-test process. Additionally, existing solutions and test strategies for conventional and energy-efficient devices are examined, making the book a valuable resource for professionals and students in the field of semiconductor engineering.