Noise Figure Characterization

The book "Noise Figure Characterization" provides a comprehensive introduction to the concept of Noise Figure (NF) and the methods for conducting NF measurements. It is aimed at both students and professionals, with a focus on measuring NF at the wafer level. The work covers the fundamentals of NF, including definitions and sources, and offers a detailed overview of the principles of NF measurement. A key feature of the book is the integration of the NF measurement system with S-parameter measurement to achieve more accurate results. The authors explain the various elements involved in the measurement setup and provide graphical representations to connect the Device under Test (DUT) with the measurement instrument. The DUTs used are commercially available, and their specifications are published, ensuring the reliability of the results.