Development and Characterization of a Dispersion-Encoded Method for Low-Coherence Interferometry

The book "Development and Characterization of a Dispersion-Encoded Method for Low-Coherence Interferometry" offers a comprehensive investigation into an extension of low-coherence interferometry through dispersion encoding. It addresses theoretical foundations and practical applications in areas such as surface profilometry, estimation of polymer crosslinking density, and determination of thin film thickness. The results of the characterization demonstrate remarkable advancements, including an axial measurement range of 79.91 µm and an axial resolution of 0.1 nm. Additionally, profiles of up to 1.5 mm in length are captured in a scan-free manner, representing a significant improvement compared to existing methods. The book also highlights the decoupling of axial and lateral measurement ranges, as well as the estimation of functional parameters such as surface roughness. The characterization of the degree of polymer crosslinking is conducted based on the refractive index and is performed with a spatially resolved resolution of 3.36 x 10^-5, supported by a newly developed mathematical analysis approach.